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The Way to Perfection

Updated: May 3, 2021



Following article featured in IITM TECH TALK talks about the research conducted by Prof. G.L. Samuel and Shalini Singh on Ultrafast pulse laser inscription technique's applicability to achieve high ablation depth on uncoated silicon wafer.


Link to the Article: The Way to Perfection


Link to the Journal Paper: Ultrafast pulse laser inscription and surface quality characterization of micro-structured silicon wafer